PC HV TEST STAND LOG

Auxilliary Tests

Prior to the normal suite of tests, the 1469 modules were set (at default trip currents) to 3500 volts, without loads, for several hours.  Tbis was done to assure that an infrequent trip problem noted in the prototypes was no longer present in the new modules.

Test date:  30 March, 1999

Test Adminsitered by :  Mike Sivertz and Ryan Roth                           Number of Modules Tested:   6 (1-6)
Module Type:  1469P                                                                                     Sub-System:  PC
Test Database Name:   03.30.09.50.43                                                     Test Database FileName:  03.30.09.50.43.TheDB.DB

Long Term Test Run From  11:56:09 30 March to 08:54:11 31 March     LT Voltage = -3500V

Non-Load LT Channel Trip = -0.30 uA                                                       Non-Load LT Bulk Trip = -10 uA

Load LT Channel Trip = -5 uA                                                                       Load LT Bulk Trip = -40 uA
 

Module Serial#        Channel Name    Errors?     Set Aside?   LT Load?
**************************************************************************
B51144                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B51191                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B51129                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B67756                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B51135                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B67738                Bulks 00 - 02    No           No           Yes
                      Chans 00 - 23

**************************************************************************

Notes:

  1. The short term tests of these modules revealed no problems and there was only a single trip during the long term test (which is not considered significant).
Test date:  31 March, 1999

Test Adminsitered by :  Mike Sivertz and Ryan Roth                          Number of Modules Tested:   6 (7-12)
Module Type:  1469P                                                                                    Sub-System:  PC
Test Database Name:    03.31.11.32.21                                                   Test Database FileName:  03.31.11.32.21.TheDB.DB

Long Term Test Run From   11:34:44 31 March to 08:40:14 1 April        LT Voltage = -3500V

Non-Load LT Channel Trip = -0.30 uA                                                      Non-Load LT Bulk Trip = -10 uA

Load LT Channel Trip = -5 uA                                                                      Load LT Bulk Trip = -40 uA
 

Module Serial#        Channel Name    Errors?     Set Aside?   LT Load?
**************************************************************************
B51077                Bulks 00 - 02    No           Yes          No
                      Chans 00 - 23    Yes (1)

B51149                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B67733                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B51194                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B67757                Bulks 00 - 02    No           No           No
                      Chans 00 - 23    No

B51233                Bulks 00 - 02    No           No           Yes
                      Chans 00 - 23    No

**************************************************************************

Notes:

  1. During the short term tests, it was discovered that the channels of B51077 would, with or without a load, report a measured current that flucuated between 5 and 100 microamps.  All of the channels were subject to this error.  This error, left alone, would cause the long term test to operate very slowly, since the program would see the excessive current and resultant trip and try to clear the channel.  Thus, most of the program's time would be taking in trying to re-enable channels that would just trip immediately anyway.  This would lead to a very low number of data points in the database for all modules involded in the test.  To prevent such an occurance, the channels of B51077 were disabled prior to starting the long term test, so that the program would not waste time with them.  This means that the database will have recorded zero voltage for all the channels of B51077.
  2. Other than B51077, only two channels tripped during the long-term test.  They were B51194_18 (which tripped only once) and B51194_10 (which tripped fifteen times).  Examination of the log shows that B51194_10 was stable for the bulk of the test, but then continuously tripped after every re-enable.  It is likely that, had the test proceeded longer, this channel would have reached the 20 re-enable limit.   The high number of trips generated by B51194_10 were most likely the result of the 1469s tendacy to trip when the trip current is set very low while no load was attached.  To verify this, this module was run under a long term test with loads for 23 hours -- during this time, no channel of the module tripped even once.  Therefore, this module will not be sent back to LeCroy.
  3. Here are the plots of these two channels:


PC_1469P.gif Trips