MVD HV TEST STAND LOG
Auxilliary Tests
In addition to the normal suite of tests, the MVD 1461P410 modules, due
to the much lower voltage output, were given a few additional procedures.
Polarity Test - For every module, a voltmeter was used to verify
that the output voltage had positive polarity. All modules passed
this test. (12/8/98)
HVL Set - The hardware HVL limit for the module was trimmed
back so that each module could only provide a maximum of 70 Volts. (12/8/98)
Ripple Measurements - Under the 620k loads, a digital
oscilloscope was used to examine the voltage waveform and ripple.
These result are still being examined
and the test will be repeated with different loads
at a later date.
AC RMS - The RMS voltage was measured with a RMS voltmeter for
all channels. However, the results seemed to be unreliable and did
not concur with
measurements from the digital o-scope. The
results are currently under examination.
Test date: 10 December, 1998
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (1 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 12.10.16.24.25
Test Database FileName: 12.10.16.24.25.TheDB.DB
Long Term Test Run From 16:34:05 to 08:42:16
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68206
B68206_01 No
No 620k
B68206_02 No
B68206_03 No
B68206_04 No
B68206_05 No
B68206_06 No
B68206_07 No
B68206_08 No
B68206_09 No
B68206_10 No
B68206_11 No
B68206_12 No
**************************************************************************
Notes:
-
Due to the low current trip setting, occassionally, when a channel is ramping
from zero to an amount greater than 40 or so volts, the sudden change can
cause the current to surge above the current trip limit. That is,
channels occasionally have current trips during the ramp ups. The
trip is easily cleared and thereafter causes no problems. This effect
is something that must be taken into account when the controlling software
for this system is developed. It may help to reduce the ramp up rate
-- the test was conducted using a ramp rates of 50 V/s.
-
During the Auxilliary tests, it was noted that some of the modules' cable
connectors were slightly faulty. They would provide voltage, but,
if the cable were moved or jingled slightly, the voltage would disappear
for one or more channels. For at least one module, an entire connector
(6 channels) was found to be faulty. This being the case, a few additional
checks will be preformed to make sure the voltage doesn't disappear from
the loads due to cable movement.
Test date: 14 December, 1998
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (2 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 12.14.14.41.16
Test Database FileName: 12.14.14.41.16.TheDB.DB
Long Term Test Run From 14:47:55 to 08:47:05
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68169
B68169_01 No
No 620k
B68169_02 No
B68169_03 No
B68169_04 No
B68169_05 No
B68169_06 No
B68169_07 No
B68169_08 No
B68169_09 No
B68169_10 No
B68169_11 No
B68169_12 No
**************************************************************************
Notes:
-
For this test, a Ramp Up Rate of 3 V/s was used, in the hopes that this
would prevent the current trips caused by ramping voltages. No trips
occured in this run, so I will continue using this ramp rate for the remaining
tests.
Test date: 15 December, 1998
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (3 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 12.15.15.13.45
Test Database FileName: 12.15.15.13.45.TheDB.DB
Long Term Test Run From 15:19:27 to 08:52:15
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68210
B68210_01 No
No 620k
B68210_02 No
B68210_03 No
B68210_04 No
B68210_05 No
B68210_06 No
B68210_07 No
B68210_08 No
B68210_09 No
B68210_10 No
B68210_11 No
B68210_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips occured
in this run.
Test date: 16 December, 1998
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (4 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 12.16.16.00.04
Test Database FileName: 12.16.16.00.04.TheDB.DB
Long Term Test Run From 16:05:50 to 08:46:47
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68191
B68191_01 No
No 620k
B68191_02 No
B68191_03 No
B68191_04 No
B68191_05 No
B68191_06 No
B68191_07 No
B68191_08 No
B68191_09 No
B68191_10 No
B68191_11 No
B68191_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips occured
in this run.
-
During the preliminary tests, it was discovered that voltage was seemingly
not delivered to the bottom eight channels of this module (this result
was found using a multimeter at low voltages). However, this module
passed the normal tests perfectly, and was able to deliver voltage and
current at appropriate levels. I believe that the bottom connector
of this module has pins that are slightly sunken or otherwise shortened,
which prevented multimeter from making contact with them. Add to
this the fact that a cable (which was later replaced) used in the preliminary
testing was found to have weak connections to its pins, and the false conclusion
that the module connector is broken is explained. I believe that,
so long as the cable connected to this module is well-made, this module
should not have any problems. It would most likely be a good idea
to verify the voltage delivery of ALL modules after they have been placed
in the racks but before they are mounted in the PEH.
Test date: 17 December, 1998
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (5 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 12.17.15.23.44
Test Database FileName: 12.17.15.23.44.TheDB.DB
Long Term Test Run From 15:29:36 to 08:51:09
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68212
B68212_01 No
No 620k
B68212_02 No
B68212_03 No
B68212_04 No
B68212_05 No
B68212_06 No
B68212_07 No
B68212_08 No
B68212_09 No
B68212_10 No
B68212_11 No
B68212_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips occured
in this run.
Test date: 4 January, 1999
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (6 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 01.04.14.59.15
Test Database FileName: 01.04.14.59.15.TheDB.DB
Long Term Test Run From 15:05:26 to 09:00:07
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68170
B68170_01 No
No 620k
B68170_02 No
B68170_03 No
B68170_04 No
B68170_05 No
B68170_06 No
B68170_07 No
B68170_08 No
B68170_09 No
B68170_10 No
B68170_11 No
B68170_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips or
other problems occured in this test.
Test date: 5 January, 1999
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (7 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 01.05.14.57.39
Test Database FileName: 01.05.14.57.39.TheDB.DB
Long Term Test Run From 15:13:59 to 09:12:38
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68202
B68202_01 No
No 620k
B68202_02 No
B68202_03 No
B68202_04 No
B68202_05 No
B68202_06 No
B68202_07 No (2)
B68202_08 No
B68202_09 No
B68202_10 No
B68202_11 No
B68202_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips occured.
-
Due to a faulty cable, channel B68202_07 was not properly connected to
the load, and thus its database entries do not record a current draw.
This should not have effected teh results of the long term test, which
does not examine the measured current. Switching cables verified
that the channel was working properly, and that the cable was at fault.
Test date: 11 January, 1999
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (8 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 01.11.11.22.09
Test Database FileName: 01.11.11.22.09.TheDB.DB
Long Term Test Run From 11:32:56 to 10:41:40
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68165
B68165_01 No
No 620k
B68165_02 No
B68165_03 No
B68165_04 No
B68165_05 No
B68165_06 No
B68165_07 No
B68165_08 No
B68165_09 No
B68165_10 No
B68165_11 No
B68165_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips occured.
-
The repair of a faulty dummy load cable delayed the testing of these HV
modules a few days.
Test date: 12 January, 1999
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (9 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 01.12.11.04.37
Test Database FileName: 01.12.11.04.37.TheDB.DB
Long Term Test Run From 11:14:05 to 09:11:12
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68211
B68211_01 No
No 620k
B68211_02 No
B68211_03 No
B68211_04 No
B68211_05 No
B68211_06 No
B68211_07 No
B68211_08 No
B68211_09 No
B68211_10 No
B68211_11 No
B68211_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips occured.
Test date: 14 January, 1999
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (10 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 01.14.09.36.15
Test Database FileName: 01.14.09.36.15.TheDB.DB
Long Term Test Run From 9:41:36 to 08:42:15
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68195
B68195_01 No
No 620k
B68195_02 No
B68195_03 No
B68195_04 No
B68195_05 No
B68195_06 No
B68195_07 No
B68195_08 No
B68195_09 No
B68195_10 No
B68195_11 No
B68195_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips occured.
Test date: 19 January, 1999
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (11 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 01.19.09.14.00
Test Database FileName: 01.19.09.14.00.TheDB.DB
Long Term Test Run From 9:19:56 to 09:14:02
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68180
B68180_01 No
No 620k
B68180_02 No
B68180_03 No
B68180_04 No
B68180_05 No
B68180_06 No
B68180_07 No
B68180_08 No
B68180_09 No
B68180_10 No
B68180_11 No
B68180_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test. No trips occured.
Test date: 20 January, 1999
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (12 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 01.20.10.30.28
Test Database FileName: 01.20.10.30.28.TheDB.DB
Long Term Test Run From 10:49:16 to 08:53:06
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68187
B68187_01 No
No 620k
B68187_02 No
B68187_03 No
B68187_04 No
B68187_05 No
B68187_06 No
B68187_07 No
B68187_08 No
B68187_09 No
B68187_10 No
B68187_11 No
B68187_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test.
-
There were a few problems during this test procedure -- the module failed
to pass some of the tests. After repeating the tests twice, it was
determined that the problems were network-related, and not the result of
a bad channel on the module itself. All but the long-term test were
preformed three seperate times to verify this.
Test date: 21 January, 1999
Test Adminsitered by : Ryan Roth
Number of Modules Tested: 1 (13 of 13)
Module Type: 1461P410
Sub-System: MVD
Test Database Name: 01.21.09.27.40
Test Database FileName: 01.21.09.27.40.TheDB.DB
Long Term Test Run From 09:35:48 to 09:03:32
Long Term Voltage = 48V
Module Serial# Channel Name
Errors? Set Aside? Load?
**************************************************************************
B68168
B68168_01 No
No 620k
B68168_02 No
B68168_03 No
B68168_04 No
B68168_05 No
B68168_06 No
B68168_07 No
B68168_08 No
B68168_09 No
B68168_10 No
B68168_11 No
B68168_12 No
**************************************************************************
Notes:
-
Again, a Ramp Up Rate of 3 V/s was used for this test.