PPT Slide
Problems in High-Occupancy Events--Tracker
- Overlapping hits which makes cluster fitting more complicated
In principle, not a problem
- If too many overlapping hits, not enough information in a cluster to extract all hit positions accurately
If too many of these, track and mass resolution is lost
Could possibly save some of these by looking at charge in other
cathode cluster in the gap
- More ADC overflows==>loss of information
Some resolution degradation
- Pattern recognition must throw out ghost hits as early as possible so combinatorics don’t get too large
Difficult to maintain efficiency since each cut removes some good